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Normal-superconducting transition induced by high current densities in YBa2Cu3O7-d melt-textured samples and thin films: Similarities and differences

机译:高电流密度引起的正常超导跃迁   YBa2Cu3O7-d熔融织构样品和薄膜:相似和   分歧

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摘要

Current-voltage characteristics of top seeded melt-textured YBa2Cu3O7-d arepresented. The samples were cut out of centimetric monoliths. Filmscharacteristics were also measured on microbridges patterned on thin filmsgrown by dc sputtering. For both types of samples, a quasi-discontinuity orquenching was observed for a current density J* several times the criticalcurrent density Jc. Though films and bulks much differ in their magnitude ofboth Jc and J*, a proposal is made as to a common intrinsic origin of thequenching phenomenon. The unique temperature dependence observed for the ratioJ*/Jc, as well as the explanation of the pre-quenching regime in terms of asingle dissipation model lend support to our proposal.
机译:给出了顶部晶种的熔融织构YBa2Cu3O7-d的电流-电压特性。将样品切出厘米整料。在通过直流溅射生长的薄膜上构图的微桥上也测量了薄膜的特性。对于这两种类型的样品,在几倍于临界电流密度Jc的电流密度J *下观察到准间断淬火。尽管薄膜和块的大小在Jc和J *上都相差很大,但有人提出了淬火现象的共同内在根源。对于比率J * / Jc观察到的独特的温度依赖性,以及根据单耗散模型对预淬火状态的解释为我们的建议提供了支持。

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